Paper
1 December 1991 Temperature rise due to dynamic crack growth in Beta-C titanium
Alan T. Zehnder, Jacob A. Kallivayalil
Author Affiliations +
Abstract
The temperature rise at the tip of dynamically propagating cracks in Beta-C titanium is measured using an array of high speed infrared detectors. For a crack propagating at 396 m/s the maximum crack tip temperature rise is 450°C. This is high enough that the mechanical properties of the material at the crack tip will be changed, thus affecting the fracture process in a significant manner.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alan T. Zehnder and Jacob A. Kallivayalil "Temperature rise due to dynamic crack growth in Beta-C titanium", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.49479
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Cited by 5 scholarly publications.
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KEYWORDS
Sensors

Calibration

Temperature metrology

Infrared sensors

Titanium

Infrared detectors

Mechanics

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