High-resolution computer-aided moire

Cesar A. Sciammarella; Gopalakrishna K. Bhat

doi:10.1117/12.57486

1 December 1991 High-resolution computer-aided moiré

Cesar A. Sciammarella, Gopalakrishna K. Bhat

Proceedings Volume 1554, Second International Conference on Photomechanics and Speckle Metrology; (1991) https://doi.org/10.1117/12.57486
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

This paper presents a high resolution computer assisted moiré technique for the measurement of displacements and strains at the microscopic level. The detection of micro-displacements using a moiré grid and the problem associated with the recovery of displacement field from the sampled values of the grid intensity are discussed. A two dimensional Fourier transform method for the extraction of displacements from the image of the moiré grid is outlined. An example of application of the technique to the measurement of strains and stresses in the vicinity of the crack tip in a compact tension specimen is given.

Citation Download Citation

Cesar A. Sciammarella and Gopalakrishna K. Bhat "High-resolution computer-aided moiré", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.57486

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