Diagnostics of arc plasma by moire deflectometry

Yiqing Gao; Yupin Liu

doi:10.1117/12.57502

1 December 1991 Diagnostics of arc plasma by moiré deflectometry

Yiqing Gao, Yupin Liu

Proceedings Volume 1554, Second International Conference on Photomechanics and Speckle Metrology; (1991) https://doi.org/10.1117/12.57502
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

This paper presents a new method to diagnose the welding arc temperature field on the basis of plasma physics, Talbot effect and moiré techniques. This method has advantages of immunity to mechanical shock and vibration, tunable sensitivity and considerably simple optical system.

Citation Download Citation

Yiqing Gao and Yupin Liu "Diagnostics of arc plasma by moiré deflectometry", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.57502

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