Critical-angle refractometry: accuracy analysis

Diana Tentori

doi:10.1117/12.48652

1 December 1991 Critical-angle refractometry: accuracy analysis

Diana Tentori

Proceedings Volume 1527, Current Developments in Optical Design and Optical Engineering; (1991) https://doi.org/10.1117/12.48652
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

An analysis of the measuring accuracy that can be obtained using critical angle refractometry as a direct and an indirect method is made. The working conditions required to get the highest accuracy are discussed.

Citation Download Citation

Diana Tentori "Critical-angle refractometry: accuracy analysis", Proc. SPIE 1527, Current Developments in Optical Design and Optical Engineering, (1 December 1991); https://doi.org/10.1117/12.48652

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KEYWORDS

Prisms

Refractive index

Error analysis

Refractometry

Optical engineering

Optical design

Polishing

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