Nonoptical noncoherent imaging in industrial testing

Z. A. Delecki; Moe A. Barakat

doi:10.1117/12.48245

1 September 1991 Nonoptical noncoherent imaging in industrial testing

Z. A. Delecki, Moe A. Barakat

Proceedings Volume 1526, Industrial Vision Metrology; (1991) https://doi.org/10.1117/12.48245
Event: Industrial Vision Metrology, 1991, Winnipeg, Canada

Abstract

A method is described for generation of an image from measurements of weak electromagnetic signals in a region close to their source. A computer-assisted contactless test system consists of an array of sensors exposed to the reactive electric and magnetic fields surrounding the printed circuit-board assembly. In a reference plane located a distance small in comparison to the wavelength a probe antenna scans the fields generated by its source; the signal from the sensor is acquired in the frequency domain by a spectrum analyzer and then transferred to a controlling computer. Measurements are made on a regularly spaced grid in a plane parallel to the board. A noncoherent estimate of pixel value is defined. This estimate is computed for each node of a grid. A practical implementation of the method and a simple fault detection technique are presented.

Citation Download Citation

Z. A. Delecki and Moe A. Barakat "Nonoptical noncoherent imaging in industrial testing", Proc. SPIE 1526, Industrial Vision Metrology, (1 September 1991); https://doi.org/10.1117/12.48245

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