New options of holographic metrology

Hans Steinbichler

doi:10.1117/12.47064

1 September 1991 New options of holographic metrology

Hans Steinbichler

Proceedings Volume 1507, Holographic Optics III: Principles and Applications; (1991) https://doi.org/10.1117/12.47064
Event: ECO4 (The Hague '91), 1991, The Hague, Netherlands

Abstract

Through the combination with digital diagram image processing evaluation, completely new application techniques are created for already known optical procedures. In deformation and vibration analysis with holographic and speckle interferometry, fringe patterns, diagrams which represent very exact deformations or vibration amplitudes are evaluated. However, the projection or Moire systems, the micro- and macrostructures of the surfaces, as for example the 3-dimensional shape, can also be recorded. By means of a suitable evaluation, a partial frequency analysis of deformation shapes generated during operation is possible. The applications are described using concrete examples from the automotive industry which are partly obtained under difficult circumstances, such as with rotating components.

Citation Download Citation

Hans Steinbichler "New options of holographic metrology", Proc. SPIE 1507, Holographic Optics III: Principles and Applications, (1 September 1991); https://doi.org/10.1117/12.47064

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