InGaAs-GaAs strained layer lasers: physics and reliability

James J. Coleman; Robert G. Waters; David P. Bour

doi:10.1117/12.43810

1 July 1991 InGaAs-GaAs strained layer lasers: physics and reliability

James J. Coleman, Robert G. Waters, David P. Bour

Proceedings Volume 1418, Laser Diode Technology and Applications III; (1991) https://doi.org/10.1117/12.43810
Event: Optics, Electro-Optics, and Laser Applications in Science and Engineering, 1991, Los Angeles, CA, United States

Abstract

Strained-layer (In)GaAs laser technology is being pursued at a number of laboratories with a view to extending the emission spectrum to longer wavelengths and exploiting strain-induced band-structure effects. Recently, remarkable longevity has been demonstrated for such devices and the implications for existing applications should insure continued research activity. Moreover, all of the key laser performance parameters -- efficiency, threshold current density and characteristic temperature -- have matched or exceeded their values for high-quality GaAs quantum wells. Evidence is mounting that the degradation phenomenology in pseudomorphic InGaAs lasers is radically different than in GaAs -- and for the better. Dark-line growth is inhibited, the derivative 'freak' failures cease to limit the lifetime and gradual degradation rates are tolerably low. This leads to the prospect of unity yield and 100% survival without benefit of costly burn-in procedures. Documented (extrapolated) lifetimes of 14,000 (50,000) hours are reported.

Citation Download Citation

James J. Coleman, Robert G. Waters, and David P. Bour "InGaAs-GaAs strained layer lasers: physics and reliability", Proc. SPIE 1418, Laser Diode Technology and Applications III, (1 July 1991); https://doi.org/10.1117/12.43810

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