A software designed for automated measurement and control of digital multimeters

Yujun Xu; Zhen Jiang; Yinghu Guo; Qian Zhao; Jiangyuan Zhu; Kun Cao

doi:10.1117/12.3055433

12 December 2024 A software designed for automated measurement and control of digital multimeters

Yujun Xu, Zhen Jiang, Yinghu Guo, Qian Zhao, Jiangyuan Zhu, Kun Cao

Proceedings Volume 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024); 134390R (2024) https://doi.org/10.1117/12.3055433
Event: Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 2024, Xiamen, China

Abstract

With the continuous progress of science and technology, the requirements of measurement technology become more and more accurate and diversified. In the field of electrical measurement, the digital multimeter, as an important tool, is widely used in the measurement of parameters such as voltage, current and resistance and so on. However, the traditional manual measurement method is less efficient and easily affected by human error. Therefore, a software for automated measurement and control of the digital multimeter based on LabVIEW is designed in this paper, which is able to meet the requirements of today's measurement. The software can automatically perform an over-difference analysis to judge whether the measurement data meet the standards through the process in which, by using graphical programming LabVIEW controls the digital multimeter and also inputs signal to it with a DC voltage source in order to automatically collect and compare the measurement results of it. In this case, it can be said that the software can effectively improve the accuracy and efficiency of measurement, and can be widely applied with large potential.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yujun Xu, Zhen Jiang, Yinghu Guo, Qian Zhao, Jiangyuan Zhu, and Kun Cao "A software designed for automated measurement and control of digital multimeters", Proc. SPIE 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 134390R (12 December 2024); https://doi.org/10.1117/12.3055433

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KEYWORDS

Design

Automation

Control systems

Computer architecture

Data acquisition

LabVIEW

Signal processing

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