Noncontact precision measurement system

Ronald Gamache; John Tourtellott; John F. Wagner

doi:10.1117/12.22799

1 November 1990 Noncontact precision measurement system

Ronald Gamache, John Tourtellott, John F. Wagner

Proceedings Volume 1333, Advanced Optical Manufacturing and Testing; (1990) https://doi.org/10.1117/12.22799
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

A gage is being developed to make precision measurements of moving surfaces in a manufacturing environment. A prototype has demonstrated submicron repeatability and accuracy at the 2- to 6-micron level as well as the ability to measure parts moving at about 1 in./min. The system is described, and the means to make the accuracy comparable to the repeatability and to increase part velocity to more than 200 in./min are indicated.

Citation Download Citation

Ronald Gamache, John Tourtellott, and John F. Wagner "Noncontact precision measurement system", Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); https://doi.org/10.1117/12.22799

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