Paper
26 September 2024 Optical field simulation of nanoscale structures on wafer surfaces based on microscopic imaging
Na Wang, Xiaojiao Song, Weihu Zhou, Guannan Li, Lituo Liu
Author Affiliations +
Proceedings Volume 13282, Second Advanced Imaging and Information Processing Conference (AIIP 2024); 132820L (2024) https://doi.org/10.1117/12.3046321
Event: Second Advanced Imaging and Information Processing Conference (AIIP 2024), 2024, Xining, China
Abstract
Periodic arrays of nanoscale structures on wafer surfaces can be fabricated using micro- and nano-fabrication processes. By changing the morphology and arrangement of array structures, precise control of light can be achieved, enabling the functionality of various optical devices. The paper simulates the nanoscale array structures on the wafer surface using Finite-Difference Time-Domain (FDTD) method and conducts microscopic imaging. After wavelength optimization, it was found that for the single-layer SiO2 array structure on the wafer surface, with shorter illumination wavelengths and larger objective numerical apertures, the characteristic information of the SiO2 structure becomes more prominent in the microscopic imaging. However, for the multi-layer SiO2-Si3N4-SiO2 array structure on the wafer surface, the illumination source no longer follows the principle that shorter wavelengths and larger numerical apertures result in better imaging quality. Instead, the optimal imaging quality is achieved with illumination wavelengths in the range of 230nm-260nm and a numerical aperture of 0.55 for the objective lens. Therefore, in practical testing, appropriate illumination wavelengths and numerical apertures for the objective lens should be selected to achieve the best imaging quality.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Na Wang, Xiaojiao Song, Weihu Zhou, Guannan Li, and Lituo Liu "Optical field simulation of nanoscale structures on wafer surfaces based on microscopic imaging", Proc. SPIE 13282, Second Advanced Imaging and Information Processing Conference (AIIP 2024), 132820L (26 September 2024); https://doi.org/10.1117/12.3046321
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KEYWORDS
Semiconducting wafers

Imaging arrays

Computer simulations

Light sources and illumination

Light sources

Objectives

Wafer level optics

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