Paper
8 November 2024 High-resolution polarization-dependent loss measurement using microwave photonics
Liyuan Heng, Kunqian Yang, Beibei Zhu, Min Xue, Shilong Pan
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Abstract
We propose a novel Polarization-Dependent Loss (PDL) measurement method to achieve optical device polarization characterization. The method utilizes high-fineness frequency sweeping based on Microwave Photonics (MWP) to achieve high frequency resolution. Theoretically, a sub-Hz frequency resolution is available. In the experiment, the stimulated Brillouin scattering (SBS) in a 5-km single-mode fiber serves as the device under test (DUT). The PDL is measured with a frequency resolution as high as 100 kHz over a frequency span of 400 MHz, demonstrating the advantages of high frequency resolution.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Liyuan Heng, Kunqian Yang, Beibei Zhu, Min Xue, and Shilong Pan "High-resolution polarization-dependent loss measurement using microwave photonics", Proc. SPIE 13233, Semiconductor Lasers and Applications XIV, 1323309 (8 November 2024); https://doi.org/10.1117/12.3036441
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KEYWORDS
Polarization

Microwave photonics

Single mode fibers

Laser frequency

Optical character recognition

Optical components

Polysomnography

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