Paper
8 November 2024 FPGA-based fringe projection with double light intensity via bidirectional scanning
Author Affiliations +
Abstract
Fringe projection profilometry (FPP) is a high-precision, non-contact measurement technique. The quality of 3D reconstruction largely depends on the projection quality and the number of phase shifts and frequencies. Traditional MEMS projection methods project fringes only during the forward scan, limiting projection light intensity as they do not utilize the reverse scan. To address this, a high-quality fringe projection system is developed using an FPGA and a uniaxial MEMS scanning mirror. The method projects 8-bit fringe patterns based on angle interval signals and uses both forward and reverse scans. By projecting patterns in both directions and reversing the forward pattern during the backward scan, the projection light intensity is effectively doubled compared to unidirectional methods. This bidirectional scanning approach projects the same pattern during both the forward and backward scans, doubling light intensity and improving the Signal-to-Noise Ratio (SNR) of captured images, thus enhancing the reconstruction accuracy of the MEMS-based system.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Hao Jiang, Yibo Xing, Weijian Shi, Min Han, Xiaohao Wang, and Xinghui Li "FPGA-based fringe projection with double light intensity via bidirectional scanning", Proc. SPIE 13233, Semiconductor Lasers and Applications XIV, 1323304 (8 November 2024); https://doi.org/10.1117/12.3036358
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KEYWORDS
3D modeling

3D projection

Interpolation

Field programmable gate arrays

Modulation

Reconstruction algorithms

Microelectromechanical systems

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