A new star location method based on rectangular hole Fraunhofer diffraction

Zhuoyi Chen; Jiyuan Yang; Qiong Wu; Xianghao Kong; Hua Yang; Kun Gao

doi:10.1117/12.3030739

3 June 2024 A new star location method based on rectangular hole Fraunhofer diffraction

Zhuoyi Chen, Jiyuan Yang, Qiong Wu, Xianghao Kong, Hua Yang, Kun Gao

Proceedings Volume 13182, 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024); 131820H (2024) https://doi.org/10.1117/12.3030739
Event: 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024), 2024, Kunming, China

Abstract

The traditional star sensor uses the pupil function of the lens to produce circular aperture Fraunhofer diffraction to form the diffuse spot, then enlarges the diffuse diameter by defocusing, and finally uses Gaussian fitting to determine the centroid of the star point. Compared with the traditional star sensor, this paper designs a new star location method based on rectangular hole Fraunhofer diffraction. The method first changes the optical system structure of the star sensor, so that the pupil function produces Fraunhofer diffraction image on the focal plane of the optical lens at infinite distance, and then directly determines the centroid of the star point through Gaussian fitting. Finally, the reliability of this method is verified by simulating random error. The Gaussian fitting algorithm of the new star sensor has higher accuracy, less computation burden and higher accurate reliability. Experiments show that the localization accuracy of this method can reach 0.007 pixels.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Zhuoyi Chen, Jiyuan Yang, Qiong Wu, Xianghao Kong, Hua Yang, and Kun Gao "A new star location method based on rectangular hole Fraunhofer diffraction", Proc. SPIE 13182, 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024), 131820H (3 June 2024); https://doi.org/10.1117/12.3030739

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KEYWORDS

Stars

Star sensors

Charge-coupled devices

Diffraction

Far field diffraction

Image processing

Image sensors

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