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16 May 2024 Simulation research on the reflection characteristics of typical microsurfaces for remote sensing targets
Xiaojie Yu, Tianyu Wu, Jia Yi, Yong Tan
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Proceedings Volume 13166, International Conference on Remote Sensing Technology and Survey Mapping (RSTSM 2024); 131660I (2024) https://doi.org/10.1117/12.3029399
Event: International Conference on Remote Sensing Technology and Survey Mapping (RSTSM 2024), 2024, Changchun, China
Abstract
In recent years, with the advancement of remote sensing technology, there has been an increasing reliance on computer graphics to render terrain targets and obtain intuitive images. However, the lighting properties of material surfaces are crucial physical factors that impact the rendering effect, directly influencing the visual appearance of the target under various lighting conditions. This article delves into the diversity of materials and the intricacies of light reflection, examining the modeling methods and simulation effects of material surface lighting properties. By leveraging the intersection test results of objects and light, we employ the Blinn-Phong lighting model to introduce the optical characteristics of remote sensing target micro surface materials for simulation. This lays the foundation for remote sensing image stitching and other related tasks.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Xiaojie Yu, Tianyu Wu, Jia Yi, and Yong Tan "Simulation research on the reflection characteristics of typical microsurfaces for remote sensing targets", Proc. SPIE 13166, International Conference on Remote Sensing Technology and Survey Mapping (RSTSM 2024), 131660I (16 May 2024); https://doi.org/10.1117/12.3029399
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KEYWORDS
Reflection
Remote sensing
Light sources
Ray tracing
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