Poster + Paper
27 August 2024 Continued developments in x-ray speed reading: fast, low noise readout for next-generation wide-field imagers
Sven Herrmann, Peter Orel, Tanmoy Chattopadhyay, Glenn Morris, Gregory Prigozhin, Haley R. Stueber, Steven W. Allen, Marshall W. Bautz, Kevan Donlon, Beverly LaMarr, Chris Leitz, Eric Miller, Abigail Pan, Artem Poliszczuk, Daniel R. Wilkins
Author Affiliations +
Conference Poster
Abstract
Future strategic x-ray astronomy missions will require unprecedentedly sensitive wide-field imagers providing high frame rates, low readout noise and excellent soft energy response. To meet these needs, our team is employing a multi-pronged approach to advance several key areas of technology. Our first focus is on advanced readout electronics, specifically integrated electronics, where we are collaborating on the VERITAS readout chip for the Athena Wide Field Imager, and have developed the Multi-Channel Readout Chip (MCRC), which enables fast readout and high frame rates for MIT-LL JFET (junction field effect transistor) CCDs. Second, we are contributing to novel detector development, specifically the SiSeRO (Single electron Sensitive Read Out) devices fabricated at MIT Lincoln Laboratory, and their advanced readout, to achieve sub-electron noise performance. Hardware components set the stage for performance, but their efficient utilization relies on software and algorithms for signal and event processing. Our group is developing digital waveform filtering and AI methods to augment detector performance, including enhanced particle background screening and improved event characterization. All of these efforts make use of an efficient, new x-ray beamline facility at Stanford, where components and concepts can be tested and characterized.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Sven Herrmann, Peter Orel, Tanmoy Chattopadhyay, Glenn Morris, Gregory Prigozhin, Haley R. Stueber, Steven W. Allen, Marshall W. Bautz, Kevan Donlon, Beverly LaMarr, Chris Leitz, Eric Miller, Abigail Pan, Artem Poliszczuk, and Daniel R. Wilkins "Continued developments in x-ray speed reading: fast, low noise readout for next-generation wide-field imagers", Proc. SPIE 13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI, 131031H (27 August 2024); https://doi.org/10.1117/12.3018198
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KEYWORDS
Charge-coupled devices

X-rays

Sensors

CCD image sensors

Field effect transistors

Signal processing

Imaging systems

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