Simulation-based test bed for data association algorithms

Donald E. Brown; C. Louis Pittard; Andrew R. Spillane

doi:10.1117/12.21630

1 October 1990 Simulation-based test bed for data association algorithms

Donald E. Brown, C. Louis Pittard, Andrew R. Spillane

Proceedings Volume 1306, Sensor Fusion III; (1990) https://doi.org/10.1117/12.21630
Event: 1990 Technical Symposium on Optics, Electro-Optics, and Sensors, 1990, Orlando, FL, United States

Abstract

The problem of associating data in a domain with noisy sensor inputs is of considerable importance in a wide variety of problem areas. Data association algorithms provide an approach for automatically correlating and combining incoming sensor data. A number of association algorithms have been developed; however, evaluating the effectiveness of these algorithms is difficult because traditional evaluation methods fail to provide meaningful meansures of relative merit. These traditional measures are troublesome because the type I and type II errors upon which they are based lose all meaning after reports are combined in a data base. This paper describes a test bed which uses an alternative approach for measuring the performance of association algorithms. Like the traditional measures, the approach described here requires the use of simulated sensor data. The evaluation procedure is based on a measure of the distance between a baseline representation and the representation produced by the association algorithm at some time instant. Two choices for this baseline representation are listed and scores are defmed between these baselines and an algorithm's representation. A description of the test bed architecture which implements this evaluation procedure is provided, as well as, sample outputs from performing algorithm evaluations in the test bed.

Citation Download Citation

Donald E. Brown, C. Louis Pittard, and Andrew R. Spillane "Simulation-based test bed for data association algorithms", Proc. SPIE 1306, Sensor Fusion III, (1 October 1990); https://doi.org/10.1117/12.21630

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available