Presentation + Paper
7 June 2024 Image-plane speckle contrast and Fλ/d in active imaging systems
Joshua Follansbee, Eric Mitchell, C. Kyle Renshaw, Ronald Driggers
Author Affiliations +
Abstract
Coherent illumination of an optically rough surface creates random phase variations in the reflected electric field. Free-space propagation converts these phase variations into irradiance variations in both the pupil and image planes, known as pupil- and image-plane speckle. Infrared imaging systems are often parameterized by the quantity Fλ/d, which relates the cutoff frequencies passed by the optical diffraction MTF to the frequencies passed by the detector MTF. We present both analytical expressions and Monte-Carlo wave-optics simulations to determine the relationship between image-plane speckle contrast and the first-order system parameters utilized in Fλ/d (focal length, aperture size, wavelength, and detector size). For designers of active imaging systems, this paper provides input on speckle mitigation using Fλ/d to consider in system design.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Joshua Follansbee, Eric Mitchell, C. Kyle Renshaw, and Ronald Driggers "Image-plane speckle contrast and Fλ/d in active imaging systems", Proc. SPIE 13045, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV, 1304508 (7 June 2024); https://doi.org/10.1117/12.3013515
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KEYWORDS
Speckle

Sensors

Speckle pattern

Imaging systems

Active imaging

Simulations

Monte Carlo methods

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