Evaluation of compact spectroscopic sensors in the NIR wavelength range for quality control and material analysis

Thomas Arnold; Martin De Biasio; Barbara Oliveira

doi:10.1117/12.3013865

7 June 2024 Evaluation of compact spectroscopic sensors in the NIR wavelength range for quality control and material analysis

Thomas Arnold, Martin De Biasio, Barbara Oliveira

Author Affiliations +

Proceedings Volume 13026, Next-Generation Spectroscopic Technologies XVI; 1302607 (2024) https://doi.org/10.1117/12.3013865
Event: SPIE Defense + Commercial Sensing, 2024, National Harbor, Maryland, United States

Abstract

Spectral sensing technology has rapidly evolved in recent years, with compact spectral sensors emerging as powerful tools for quality control and material analysis across diverse industrial and scientific domains. Compact spectral sensors offer significant advantages in terms of size, affordability, and versatility, making them an attractive choice for quality control and material analysis tasks. The state-of-the-art spectral sensors evaluated in this paper are sensors from Senorics (1200-1700nm, 16 channel) and from AMS (750-1050nm, 61 channel). The strengths and limitations of each sensor are evaluated, providing valuable insights for end-users, researchers, and engineers seeking to select the most suitable sensor for their specific application. Quality control and material analysis applications are the focus of this evaluation. This research underscores the key strengths and limitations of compact spectral sensors, and the potential for data fusion techniques to further enhance their capabilities. It highlights the role of these sensors in transforming quality control processes, enabling rapid and non-destructive material analysis, and ensuring compliance with stringent industry standards. The findings presented in this paper offer researchers, engineers, and practitioners a deeper understanding of the potential of the selected sensors across a range of applications. As we continue to harness these sensors for quality control and material analysis, we are on the path to achieving more efficient, reliable, and sustainable processes in a variety of industries.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

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Thomas Arnold, Martin De Biasio, and Barbara Oliveira "Evaluation of compact spectroscopic sensors in the NIR wavelength range for quality control and material analysis", Proc. SPIE 13026, Next-Generation Spectroscopic Technologies XVI, 1302607 (7 June 2024); https://doi.org/10.1117/12.3013865

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