Super-resolution hyperspectral characterisation of microwave metamaterials

Harry Penketh; Cameron P. Gallagher; Michal Mrnka; Ian R. Hooper; Christopher R. Lawrence; David B. Phillips; Euan Hendry

doi:10.1117/12.3022192

10 June 2024 Super-resolution hyperspectral characterisation of microwave metamaterials

Harry Penketh, Cameron P. Gallagher, Michal Mrnka, Ian R. Hooper, Christopher R. Lawrence, David B. Phillips, Euan Hendry

Author Affiliations +

Proceedings Volume 12990, Metamaterials XIV; 1299009 (2024) https://doi.org/10.1117/12.3022192
Event: SPIE Photonics Europe, 2024, Strasbourg, France

Abstract

Between the design and final realization of a working metasurface lies the potential for a myriad of complications: fabrication tolerances, material permittivity uncertainties, alignment issues and localized defects to name just a few. Global methods of characterizing an entire surface are often incapable of separating these candidates and typically one must resort to the simulation of a wide parameter space to begin to understand experimental discrepancies. In this work we introduce a new imaging technique that is able to locate and discern the resonant frequencies of individual antennas in a complex microwave metasurface. This is achieved with a microwave single-pixel camera using patterned optical excitation of a silicon layer adjacent to the metamaterial to achieve super-resolution. This approach allows us to locate and diagnose fabrication defects, spectrally characterize individual meta-atoms, and visualize inhomogeneous broadening across our samples with below λ/20 resolution, over large areas and in near real-time.

Conference Presentation

Citation Download Citation

Harry Penketh, Cameron P. Gallagher, Michal Mrnka, Ian R. Hooper, Christopher R. Lawrence, David B. Phillips, and Euan Hendry "Super-resolution hyperspectral characterisation of microwave metamaterials", Proc. SPIE 12990, Metamaterials XIV, 1299009 (10 June 2024); https://doi.org/10.1117/12.3022192

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