Effective computer software unit testing: thinking about unit test-driven development (UTDD) mode

Yu Fang; Fang Tian; Wenbo Wang; Wenxing Li

doi:10.1117/12.3012428

21 December 2023 Effective computer software unit testing: thinking about unit test-driven development (UTDD) mode

Yu Fang, Fang Tian, Wenbo Wang, Wenxing Li

Proceedings Volume 12970, Fourth International Conference on Signal Processing and Computer Science (SPCS 2023); 1297030 (2023) https://doi.org/10.1117/12.3012428
Event: Fourth International Conference on Signal Processing and Computer Science (SPCS 2023), 2023, Guilin, China

Abstract

Unit testing is a crucial quality assurance activity within the computer software development process. The efficacy of unit testing significantly impacts the final quality of software products. However, given the rapid pace of software development and release in today's industry, conventional unit testing is gradually proving inadequate in meeting requirements due to its limited effectiveness. In light of the existing circumstances and challenges associated with unit testing, this article introduces the evolving trajectory of unit testing while considering effectiveness. It delves into the attributes and benefits of Unit Test-Driven Development (UTDD) as a central focus for advancing the approach to unit testing. Additionally, it explores avenues for further enhancement in this direction.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yu Fang, Fang Tian, Wenbo Wang, and Wenxing Li "Effective computer software unit testing: thinking about unit test-driven development (UTDD) mode", Proc. SPIE 12970, Fourth International Conference on Signal Processing and Computer Science (SPCS 2023), 1297030 (21 December 2023); https://doi.org/10.1117/12.3012428

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