Paper
11 March 2024 A new imaging method based on terahertz detection platform
Author Affiliations +
Abstract
Because of terahertz waves high frequency, low photon energy and high non-polar penetration, terahertz waves have become the focus of worldwide attention and research in recent years. Terahertz wave imaging technology has become an important aspect of the research of terahertz wave technology because of its special uses and advantages compared with x-ray, ultrasonic and infrared imaging methods. This paper studies the terahertz detection platform which can be used for non-destructive testing. Based on the analysis of different types of terahertz imaging technology in different application fields, the basic idea of using frequency-modulated continuous terahertz wave source to carry out reflective three-dimensional point-by-point scanning imaging of objects is determined by combining the characteristics of imaging samples and the requirements of system imaging indicators. Through the detection platform to detect the defects of samples with different refractive indices, and through the new quantum image algorithm to achieve image reconstruction, the corresponding defects of the samples can be clearly seen from the results, and the resolution can be further improved, laying the foundation for filling the vacancy in the field of nondestructive testing.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Siwen Bi, Niu Niu, Cheng Long, Siyuan Jiang, and Bingpeng Hao "A new imaging method based on terahertz detection platform", Proc. SPIE 12885, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVII, 1288514 (11 March 2024); https://doi.org/10.1117/12.3015001
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KEYWORDS
Image enhancement

Image processing

Quantum enhancement

Nondestructive evaluation

Terahertz detection

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