Presentation + Paper
8 March 2024 Predictive model comparisons to optical scatter measurements of structured diffusers
David A. Gonzalez, Menelaos K. Poutous
Author Affiliations +
Proceedings Volume 12882, Optical Components and Materials XXI; 128820E (2024) https://doi.org/10.1117/12.3001823
Event: SPIE OPTO, 2024, San Francisco, California, United States
Abstract
Optical-profilometric measurements provide fast, meaningful descriptions of structured surfaces, such as power spectral density and surface roughness parameters. Conventionally, profilometric height data is used to calculate the far-field scatter of a randomly-structured surface. Random nanostructures were monolithically etched on fused silica (FS) sample surfaces, to enhance spectral transmission of light beyond the boundary’s Fresnel value, within a ±2.5° projection angle in the axial direction. We fabricated several FS samples with statistically different roughness, but similar optical performance over the VIS to NIR wavelength band and compared their power spectral density and optical scatter performance. Surface height map profiles were measured using UV confocal profilometry, and the data was leveraged to produce conventional (spatial) power spectral densities for each surface. Using surface height and transverse feature size data, scatter was calculated using both Rayleigh-Rice and Harvey-Shack surface scatter models, and then compared to experimental radiometric scatter data. Using experimentally obtained profilometric height data as input, the scatter models were able to accurately predict diffuse scatter from mechanical rough surfaces compared to experimental scatter measurements; however, the models were unable to predict the axial scatter for high-density transmission-enhancing nanostructured surfaces.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
David A. Gonzalez and Menelaos K. Poutous "Predictive model comparisons to optical scatter measurements of structured diffusers", Proc. SPIE 12882, Optical Components and Materials XXI, 128820E (8 March 2024); https://doi.org/10.1117/12.3001823
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KEYWORDS
Diffusers

Aluminum

Scatter measurement

Data modeling

Reflection

Aluminum mirrors

Electromagnetic scattering theory

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