X-ray-induced acoustic effect-based microscopic imaging

Seongwook Choi; Sinyoung Park; Jiwoong Kim; Hyunhee Kim; Seonghee Cho; Sunam Kim; Jaeku Park; Chulhong Kim

doi:10.1117/12.3001182

12 March 2024 X-ray-induced acoustic effect-based microscopic imaging

Seongwook Choi, Sinyoung Park, Jiwoong Kim, Hyunhee Kim, Seonghee Cho, Sunam Kim, Jaeku Park, Chulhong Kim

Proceedings Volume 12842, Photons Plus Ultrasound: Imaging and Sensing 2024; 128420N (2024) https://doi.org/10.1117/12.3001182
Event: SPIE BiOS, 2024, San Francisco, California, United States

Abstract

The X-ray free-electron laser (XFEL) has revolutionized X-ray imaging with its high power, short pulse width, low emittance, and high coherence. We introduce X-ray-induced acoustic microscopy (XFELAM), utilizing the X-ray induced acoustic (XA) effect. We verified the XA effect and achieved micron-scale resolution by imaging patterned tungsten targets with drilled circles. XFELAM expands XFEL capabilities, enabling high-resolution visualization of materials and systems. This technique complements existing XFEL methods and promises advancements in fundamental research across fields. XAM’s unique features benefit materials science, nanotechnology, and biophysics, contributing to a deeper understanding of scientific phenomena and discoveries.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Seongwook Choi, Sinyoung Park, Jiwoong Kim, Hyunhee Kim, Seonghee Cho, Sunam Kim, Jaeku Park, and Chulhong Kim "X-ray-induced acoustic effect-based microscopic imaging", Proc. SPIE 12842, Photons Plus Ultrasound: Imaging and Sensing 2024, 128420N (12 March 2024); https://doi.org/10.1117/12.3001182

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