Paper
16 October 2023 A compositional model for cross-project effort-aware defect prediction
Lin Zhu, Yanjiao Zhang, Shuang Yin, Yanhui Li
Author Affiliations +
Proceedings Volume 12803, Fifth International Conference on Artificial Intelligence and Computer Science (AICS 2023); 128031F (2023) https://doi.org/10.1117/12.3009530
Event: 2023 5th International Conference on Artificial Intelligence and Computer Science (AICS 2023), 2023, Wuhan, China
Abstract
The Cross-Project Effort-Aware Defect Prediction (CPEADP) model can effectively use detection resources and the data from different projects to build models. One factor affecting the performance of CPEADP is the problem of data distribution differences in cross-project settings. The classification performance also greatly impacts the predictive capabilities of the models. Therefore, we propose the BDA-DF model and conduct experiments on 11 cross-project datasets from the PROMISE repository. Compared to traditional data filtering and transfer learning methods, our approach exhibits significant improvements across five effort-aware metrics, including Precision@20%, Recall@20%, F1@20%, PofB@20%, and IFA. To explore the optimal classifier for CPEADP, we embed seven different classifiers into BDA. The experimental results on the BDA embedded with different classifiers reveal that DF exhibits the best overall performance.
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Lin Zhu, Yanjiao Zhang, Shuang Yin, and Yanhui Li "A compositional model for cross-project effort-aware defect prediction", Proc. SPIE 12803, Fifth International Conference on Artificial Intelligence and Computer Science (AICS 2023), 128031F (16 October 2023); https://doi.org/10.1117/12.3009530
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KEYWORDS
Inspection

Data modeling

Lab on a chip

Machine learning

Performance modeling

Lithium

Software development

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