An optical measurement system for high precision alignment of imaging detectors

X. Chang Zeng; W. Guan; J. Zhao; P. Huang; Z. Qiang Wang; S. Zhang; X. Zhou Zuo; G. Yang Xi; B. Wei Yu; W. Ping Zhang; Z. Li Wang; X. Zhang; X. Lian Lv; W. Zheng Yuan; X. Xiao Wang; Y. He

doi:10.1117/12.2688965

28 November 2023 An optical measurement system for high precision alignment of imaging detectors

X. Chang Zeng, W. Guan, J. Zhao, P. Huang, Z. Qiang Wang, S. Zhang, X. Zhou Zuo, G. Yang Xi, B. Wei Yu, W. Ping Zhang, Z. Li Wang, X. Zhang, X. Lian Lv, W. Zheng Yuan, X. Xiao Wang, Y. He

Author Affiliations +

Proceedings Volume 12765, Optical Design and Testing XIII; 1276521 (2023) https://doi.org/10.1117/12.2688965
Event: SPIE/COS Photonics Asia, 2023, Beijing, China

Conference Poster

Abstract

The assembly positioning state of the imaging detector has an important influence on the performance of the photoelectric reconnaissance system. The axial positioning accuracy of the imaging detector will affect the imaging clarity and resolution, and the radial positioning accuracy will affect the optical axis consistency of the optical path system. The tilt, translation, rotation and position of the detector will bring multi-dimensional errors during the installation of the imaging detector, resulting in image plane misalignment, image blur and optical axis offset. In this paper, an optical measurement system is designed and built, which can automatically distinguish the installation error of the imaging detector and assist the installation of the imaging detector. The translation installation error is less than 0.015mm, and the rotation deflection error is less than 0.015 ', and the installation qualification can be given according to the clarity of the observation system image.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

X. Chang Zeng, W. Guan, J. Zhao, P. Huang, Z. Qiang Wang, S. Zhang, X. Zhou Zuo, G. Yang Xi, B. Wei Yu, W. Ping Zhang, Z. Li Wang, X. Zhang, X. Lian Lv, W. Zheng Yuan, X. Xiao Wang, and Y. He "An optical measurement system for high precision alignment of imaging detectors", Proc. SPIE 12765, Optical Design and Testing XIII, 1276521 (28 November 2023); https://doi.org/10.1117/12.2688965

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