Paper
28 July 2023 Survey on the application of machine learning in elevator fault diagnosis
Jun Gong, Yueyi Zhang, Siji Chen, Jingnan Liu
Author Affiliations +
Proceedings Volume 12756, 3rd International Conference on Applied Mathematics, Modelling, and Intelligent Computing (CAMMIC 2023); 1275638 (2023) https://doi.org/10.1117/12.2686127
Event: 2023 3rd International Conference on Applied Mathematics, Modelling and Intelligent Computing (CAMMIC 2023), 2023, Tangshan, China
Abstract
Real time state detection and fault diagnosis are very important to the normal use and safe operation of elevators. With the development of intelligent diagnosis technology, the powerful computing power and diagnosis ad-vantages of machine learning are increasingly prominent in elevator fault detection and diagnosis. This paper summarizes the application of four typical algorithms of artificial neural network (ANN), support vector machine (SVM), Bayesian network (BN) and deep learning (DL) in elevator fault diagnosis in machine learning technology in recent years, and analyzes the method expansion and application based on its basic theory and the problems encountered in practice, The advantages and disadvantages of each method in the diagnosis process are discussed, and the improvement measures proposed at this stage are analyzed. Finally, the future research and development direction are proposed.
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Jun Gong, Yueyi Zhang, Siji Chen, and Jingnan Liu "Survey on the application of machine learning in elevator fault diagnosis", Proc. SPIE 12756, 3rd International Conference on Applied Mathematics, Modelling, and Intelligent Computing (CAMMIC 2023), 1275638 (28 July 2023); https://doi.org/10.1117/12.2686127
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KEYWORDS
Machine learning

Deep learning

Artificial neural networks

Feature extraction

Diagnostics

Data modeling

Vibration

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