Paper
28 July 2023 Simulation and modeling of quadrupole mass spectrometer fringing fields using SIMION
Author Affiliations +
Proceedings Volume 12756, 3rd International Conference on Applied Mathematics, Modelling, and Intelligent Computing (CAMMIC 2023); 127562E (2023) https://doi.org/10.1117/12.2685970
Event: 2023 3rd International Conference on Applied Mathematics, Modelling and Intelligent Computing (CAMMIC 2023), 2023, Tangshan, China
Abstract
This paper proposes an approach based on numerical simulation to enhance the accuracy and generality of fringe field modeling in Quadrupole Mass Filter (QMF) systems. The proposed method involves SIMION simulation calculations to achieve the desired outcomes. A numerical model of the potential distribution is constructed using the finite numerical difference method in the region where the QMF and end plate are connected. The exponential fringe field function is selected as the basis for approximation, and the fringe field function is obtained through the least squares method. The potential gradient curves for different end plate gaps are derived, revealing the impact of gaps on the fringe field intensity, length, and penetration into the QMF. The proposed method is validated by comparing the obtained fringe field analysis model with literature data The research establishes the reliability and validity of the proposed method for effectively analyzing the fringe fields between the end plate and the QMF electrode in QMF systems.This makes it possible to study the properties of such systems by phase-space dynamics methods.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qingyuan Yang, Zejian Huang, Tianqi Zhao, and Shangzhong Jin "Simulation and modeling of quadrupole mass spectrometer fringing fields using SIMION", Proc. SPIE 12756, 3rd International Conference on Applied Mathematics, Modelling, and Intelligent Computing (CAMMIC 2023), 127562E (28 July 2023); https://doi.org/10.1117/12.2685970
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KEYWORDS
Electrodes

Ions

Fringe analysis

Modeling

Motion models

Numerical simulations

Reliability

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