Semiconductor emitter based 32-channel spectrophotometer module for real-time process measurements

Heimo Keranen; Jouko Malinen

doi:10.1117/12.20262

1 August 1990 Semiconductor emitter based 32-channel spectrophotometer module for real-time process measurements

Heimo Keranen, Jouko Malinen

Proceedings Volume 1266, In-Process Optical Measurements and Industrial Methods; (1990) https://doi.org/10.1117/12.20262
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands

Abstract

A new type of semiconductor emitter based multichannel spectrophotometer has been designed and tested. The spectrophotometer consists of a small electrically conirolled narrow band light source an optical receiver and microprocessor electronics for data processing. The light source is based on a 32-element GaAs and GaAIAs LED chip array which is connected to a diffraction grating and feedback optics. The source is capable of emitting intensity-stabilized single-beam narrow band light pulses. The wavelength of the light pulse can be selected by the electronics without using any moving parts. The optical mechanical and optoelectronic parts of the source have been integrated to form a compact hybrid construction. Main characteristics have been tested with an experimental 32-channel spectrophotometer designed for the wavelength range 810 nm - 1060 nm. Measured wavelength half-power bandwidths are 8 nm and channel separation is 7. 5 nm. A single spectrum scan can be recorded in 8 ms. 64 scans are averaged by the microprocessor electronics and data is transferred to a PC for a multicomponent spectrum analysis program. Output light power level is better than i05 times the averaged detector noise level. The wavelength range used is optimized for near infrared transmittance (NIT) analysis of agricultural products. 1.

Citation Download Citation

Heimo Keranen and Jouko Malinen "Semiconductor emitter based 32-channel spectrophotometer module for real-time process measurements", Proc. SPIE 1266, In-Process Optical Measurements and Industrial Methods, (1 August 1990); https://doi.org/10.1117/12.20262

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