Improved illumination-induced multispectral Imaging system and machine learning approach for the examination of artworks

Marie Didier; Gabriel Bernasconi; Sébastien Blanc; Vincent Carrel; Pierre-Antoine Héritier; Pedram Pad; Andrea Dunbar

doi:10.1117/12.2673875

10 August 2023 Improved illumination-induced multispectral Imaging system and machine learning approach for the examination of artworks

Marie Didier, Gabriel Bernasconi, Sébastien Blanc, Vincent Carrel, Pierre-Antoine Héritier, Pedram Pad, Andrea Dunbar

Author Affiliations +

Proceedings Volume 12620, Optics for Arts, Architecture, and Archaeology (O3A) IX; 1262007 (2023) https://doi.org/10.1117/12.2673875
Event: SPIE Optical Metrology, 2023, Munich, Germany

Abstract

Combining machine learning and physical optical models with advanced portable equipment system, we demonstrate the applicability of a new illumination-induced multispectral imaging system to the examination and detection of forgery in antique polychromic objects.

Conference Presentation

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Marie Didier, Gabriel Bernasconi, Sébastien Blanc, Vincent Carrel, Pierre-Antoine Héritier, Pedram Pad, and Andrea Dunbar "Improved illumination-induced multispectral Imaging system and machine learning approach for the examination of artworks", Proc. SPIE 12620, Optics for Arts, Architecture, and Archaeology (O3A) IX, 1262007 (10 August 2023); https://doi.org/10.1117/12.2673875

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