Poster
10 August 2023 Infrared thermography at low temperature
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Jean-François Vandenrijt, Stéphane Roose, and Gianluca Casarosa "Infrared thermography at low temperature", Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 1261830 (10 August 2023); https://doi.org/10.1117/12.2675598
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KEYWORDS
Temperature metrology

Thermography

Infrared radiation

Emissivity

Measurement uncertainty

Infrared cameras

Vacuum

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