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We developed a fast infrared sensor to quantify the film thickness of industrially applied SiOx or AlOx plasma coatings on non-flat polymer substrates at production speed. Its underlying physical principle is comparable to infrared reflection absorption spectroscopy (IRRAS) at selected, fixed wavelengths. The coating materials can be measured via their specific phononic absorption bands in the infrared spectral range. In this paper, we demonstrate the functionality of our sensor on actual packaging materials to showcase its aptitude for industrial inline inspection. Furthermore, we discuss a possible extension of our sensor to enable spectroscopic measurements using a tunable Fabry-Pérot filter.
Benedikt Hauer,Adrian D. Dorfschmidt,Friederike Münch,Jens Scherer, andDaniel Carl
"An infrared optical sensor for quantitative inline inspection of nanocoatings on plastic products", Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126181L (15 August 2023); https://doi.org/10.1117/12.2673229
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Benedikt Hauer, Adrian D. Dorfschmidt, Friederike Münch, Jens Scherer, Daniel Carl, "An infrared optical sensor for quantitative inline inspection of nanocoatings on plastic products," Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126181L (15 August 2023); https://doi.org/10.1117/12.2673229