A microscope-based interferometer with a variable wavelength illumination system

Dariusz Litwin; Kamil Radziak; Jacek Galas; Tadeusz Kryszczyński

doi:10.1117/12.2663288

12 December 2022 A microscope-based interferometer with a variable wavelength illumination system

Dariusz Litwin, Kamil Radziak, Jacek Galas, Tadeusz Kryszczyński

Proceedings Volume 12502, 22nd Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics; 125020Z (2022) https://doi.org/10.1117/12.2663288
Event: 22nd Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2022, Wojanow, Poland

Abstract

The paper demonstrates initial results of measuring the retardance of waveplates using a variable wavelength interferometer. The instrument utilizes a continuously variable interference bandpass filter placed in a specially designed intermediate image plane. The fringe field, created by the Wollaston prism, is processed and analysed only once, which speeds up the measuring procedure. In this application a reflected-light mode configuration is presented. The solution is suitable also for transmitted-light systems. The interferometer provides the user the spectral characteristic of retardance of the waveplate across the visible spectrum. The instrument is based on a classical microscope with the Kӧhler illumination system.

Citation Download Citation

Dariusz Litwin, Kamil Radziak, Jacek Galas, and Tadeusz Kryszczyński "A microscope-based interferometer with a variable wavelength illumination system", Proc. SPIE 12502, 22nd Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 125020Z (12 December 2022); https://doi.org/10.1117/12.2663288

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KEYWORDS

Wave plates

Interferometers

Prisms

Interferometry

Image filtering

Fringe analysis

Imaging systems

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