Paper
18 November 2022 Industrial defect target detection based on YoloV5 and attention mechanism
Chunzhao Ye
Author Affiliations +
Proceedings Volume 12473, Second International Conference on Optics and Communication Technology (ICOCT 2022); 124730X (2022) https://doi.org/10.1117/12.2653431
Event: Second International Conference on Optics and Communication Technology (ICOCT 2022), 2022, Hefei, China
Abstract
Crack detection of industrial defect target detection is one of the most critical aspects of industrial product quality control, and to address the problems of false detection, missed detection and insufficient feature extraction for fine cracks in target detection, this paper introduces a hybrid attention mechanism based on the original YOLOv5, which improves the accuracy of the backbone feature extraction network for fine crack detection. The experimental results show that the target loss of the validation set of the improved YOLOv5s model converges significantly, the model training results are accurate, there is no overfitting or underfitting phenomenon, and the average accuracy mean value is improved by 3.8% compared with the original YOLOv5s model. The improved YOLOv5s model can identify and detect fine cracks under both illumination or dim conditions, and the model generalization ability is good enough to meet the relevant requirements in industrial production processes.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chunzhao Ye "Industrial defect target detection based on YoloV5 and attention mechanism", Proc. SPIE 12473, Second International Conference on Optics and Communication Technology (ICOCT 2022), 124730X (18 November 2022); https://doi.org/10.1117/12.2653431
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Detection and tracking algorithms

Target detection

Feature extraction

Data modeling

Visual process modeling

Performance modeling

Statistical modeling

Back to Top