Improvement in wavefront measurement accuracy in grating array-based zonal wavefront sensors by modulating the intensity profile of the incident beam

Nagendra Kumar; Pranjal Choudhury; Nedup Sherpa; Akanshu Chauhan; S. S. Goutam Buddha; Karuna S. Malik; Santanu Konwar; Bosanta R. Boruah

doi:10.1117/12.2648670

8 March 2023 Improvement in wavefront measurement accuracy in grating array-based zonal wavefront sensors by modulating the intensity profile of the incident beam

Nagendra Kumar, Pranjal Choudhury, Nedup Sherpa, Akanshu Chauhan, S. S. Goutam Buddha, Karuna S. Malik, Santanu Konwar, Bosanta R. Boruah

Author Affiliations +

Proceedings Volume 12445, Practical Holography XXXVII: Displays, Materials, and Applications; 124450T (2023) https://doi.org/10.1117/12.2648670
Event: SPIE OPTO, 2023, San Francisco, California, United States

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Abstract

The wavefront measurement accuracy of a grating array based zonal wavefront sensor (GAWS) can be affected by the non-uniform focal spot array and unwanted orders in the detector plane. The non-uniform focal spot array is the outcome of the non-uniform nature of the incident illumination beam’s intensity profile. This paper describes a method that dynamically modulates the laser beam’s intensity using computer generated holography, making the focal spot array uniform and eliminating unwanted spots in a detector plane, thereby enhancing the accuracy of the wavefront measurement. Here, we present proof-of-principle simulation results that demonstrate the working of the proposed improvements in GAWS.

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Nagendra Kumar, Pranjal Choudhury, Nedup Sherpa, Akanshu Chauhan, S. S. Goutam Buddha, Karuna S. Malik, Santanu Konwar, and Bosanta R. Boruah "Improvement in wavefront measurement accuracy in grating array-based zonal wavefront sensors by modulating the intensity profile of the incident beam", Proc. SPIE 12445, Practical Holography XXXVII: Displays, Materials, and Applications, 124450T (8 March 2023); https://doi.org/10.1117/12.2648670

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