Fast spectral measurement of soft x-ray emission from ultrafast laser processing

Julian Holland; Rudolf Weber; Thomas Graf

doi:10.1117/12.2649020

15 March 2023 Fast spectral measurement of soft x-ray emission from ultrafast laser processing

Julian Holland, Rudolf Weber, Thomas Graf

Proceedings Volume 12414, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems XII; 1241403 (2023) https://doi.org/10.1117/12.2649020
Event: SPIE LASE, 2023, San Francisco, California, United States

Abstract

Avoiding Pile-Up during spectral X-ray measurements during ultrafast laser processing with a single detector requires long measurement times at large distances from the processing area due to the short pulse duration and high photon fluxes. To enable fast measurements, an algorithm is presented which calculates the underlying Pile-Up free spectrum of any measured spectrum. Therefore, a statistical approach was used to describe the mean number of photons ⟨𝑛⟩ and their corresponding photon energies E_ph hitting the detector at each pulse. This number of photons hitting the detector each pulse was assumed to be geometrically distributed, whereas the photon energies follows a modified Maxwell-Boltzmann distribution, mainly defined by the temperature T_hot of the hot electrons in the laser plasma. An initial guess of ⟨𝑛⟩ and T_hot was used to calculate an expected Pile-Up spectrum at the detectors position. Comparing the calculated Pile-Up spectrum with the measured one and iteratively adjusting ⟨𝑛⟩ and T_hot results in the underlying Pile-Up free spectrum.

Conference Presentation

Citation Download Citation

Julian Holland, Rudolf Weber, and Thomas Graf "Fast spectral measurement of soft x-ray emission from ultrafast laser processing", Proc. SPIE 12414, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems XII, 1241403 (15 March 2023); https://doi.org/10.1117/12.2649020

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