Uncertainty based filtering of line structured light measurement results

Kai Wang; Jingbo Zhou; Zhaohui Ji; Yuehua Li

doi:10.1117/12.2645828

30 August 2022 Uncertainty based filtering of line structured light measurement results

Kai Wang, Jingbo Zhou, Zhaohui Ji, Yuehua Li

Proceedings Volume 12309, International Conference on Advanced Manufacturing Technology and Manufacturing Systems (ICAMTMS 2022); 123090E (2022) https://doi.org/10.1117/12.2645828
Event: International Conference on Advanced Manufacturing Technology and Manufacturing System (ICAMTMS 2022), 2022, Shijiazhuang, China

Abstract

Line structured light (LSL) measurement systems have gained more and more applications in industry. An interested profile can be easily obtained through the analysis of laser-object intersection stripe. However, all stripe center extraction methods have extraction errors which will lead to profile deviation from the ideal one. In order to reduce this error, the law of uncertainty generation and propagation for the LSL measurement system is analyzed, and a filtering procedure is carried out on this basis. The uncertainty of stripe center extraction is computed in real time by adaptive BP neural network (ABPNN). According to the measurement model and the uncertainty propagation law, the uncertainty value of the each measurement point is obtained. Then, a point cloud filtering method based on uncertainty is proposed. The surface equation is obtained by segmenting and weighting the original point cloud, and the new point cloud data is obtained by interpolation calculation. Finally, the filtered point cloud data is verified by experiments, which proves that the filtering method can improve the measurement accuracy.

Citation Download Citation

Kai Wang, Jingbo Zhou, Zhaohui Ji, and Yuehua Li "Uncertainty based filtering of line structured light measurement results", Proc. SPIE 12309, International Conference on Advanced Manufacturing Technology and Manufacturing Systems (ICAMTMS 2022), 123090E (30 August 2022); https://doi.org/10.1117/12.2645828

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KEYWORDS

3D metrology

Clouds

Imaging systems

Cameras

3D modeling

Structured light

Sensors

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