|
|
Micro/Nano Photonics: Materials and DevicesSponsored by CIS – China Instrument and Control Society (China) Cosponsored and Published by SPIE Volume 12283 The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in 2021 International Conference on Optical Instruments and Technology: Mlcro/Nano Photonics: Materials and Devices, edited by Baojun Li, Xingjun Wang, Lingling Huang, Ya Sha Yi, Proc. of SPIE 12283, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL). ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781510655713 ISBN: 9781510655720 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time) Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE). Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of fees. To obtain permission to use and share articles in this volume, visit Copyright Clearance Center at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. Printed in the United States of America by Curran Associates, Inc., under license from SPIE. Publication of record for individual papers is online in the SPIE Digital Library.
Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:
Symposium CommitteeSymposium Chairs Zheng You, CIS (China), Tsinghua University (China) David Andrews, University of East Anglia (United Kingdom) Symposium Co-chairs Tianchu Li, National Institute of Metrology, China (China) Songlin Zhuang, University of Shanghai for Science and Technology (China) Liwei Zhou, Beijing Institute of Technology (China) Shenghua Ye, Tianjin University (China) Yimo Zhang, Tianjin University (China) Guangjun Zhang, Southeast University (China) Min Gu, University of Shanghai for Science and Technology (China) Xiangang Luo, Institute of Optics and Electronics, CAS (China) Jianjun Deng, China Academy of Engineering Physics (China) Fengyi Jiang, Nanchang University (China) Technical Program Chairs Guofan Jin, Tsinghua University (China) Tianchu Li, National Institute of Metrology (China) Technical Program Co-chairs Jinxue Wang, SPIE Tiegen Liu, Tianjin University (China) Local Organizing Committee Chairs Youhua Wu, China Instrument and Control Society (China) Tong Zhang, China Instrument and Control Society (China) Local Organizing Committee Co-chairs Qun Hao, Beijing Institute of Technology (China) Guoqiang Ni, Beijing Institute of Technology (China) General Secretaries Tong Zhang, China Instrument and Control Society (China) Li Zhang, China Instrument and Control Society (China) Vice General Secretaries Liquan Dong, Beijing Institute of Technology (China) Yuejin Zhao, Beijing Institute of Technology (China) Qican Zhang, Sichuan University (China) Yu-nan Sun, Beijing Institute of Technology (China) Local Organizing Committee Xuping Zhang, Nanjing University (China) Shangzhong Jin, China Jiliang University (China) Liangcai Cao, Tsinghua University (China) Yongtian Wang, Beijing Institute of Technology (China) Chunqing Gao, Beijing Institute of Technology (China) Jian Chen, Nanjing University of Posts and Telecommunications (China) Shilong Pan, Nanjing University of Aeronautics and Astronautics (China) Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, CAS (China) Jigui Zhu, Tianjin University (China) Baojun Li, Jinan University (China) Cunlin Zhang, Capital Normal University (China) Zeren Li, Shenzhen Technology University (China) Libo Yuan, Guilin University of Electronic Technology (China) Yongcai Guo, Chongqing University (China) Tian Lan, Beijing Institute of Technology (China) Cuiling Li, Beijing Institute of Technology (China) Conference CommitteeConference Chairs Baojun Li, Jinan University (China) Xingjun Wang, Peking University (China) Lingling Huang, Beijing Institute of Technology (China) Ya Sha Yi, University of Michigan, Dearborn (United States) Conference Program Committee Renmin Ma, Peking University (China) Di Liang, Hewlett Packard Labs (United States) Daoxin Dai, Zhejiang University (China) Hideo Isshiki, The University of Electro-Communications (Japan) Yunfeng Xiao, Peking University (China) Chongjun Jin, Sun Yat-Sen University (China) Yuchao Li, Jinan University (China) Qingzhong Deng, imec (Belgium) Yating Wan, University of California, Santa Barbara (United States) Yongfeng Mei, Fudan University (China) Xiangping Li, Jinan University (China) Weiwen Zhou, Shanghai Jiaotong University (China) Bin Dong, Dalian Nationalities University (China) Xiaochen Sun, LaXense Inc. (United States) Qiaoqiang Gan, University at Buffalo (United States) Ruitao Wen, Massachusetts Institute of Technology (United States) Conference Review Committee Daoxin Dai, Zhejiang University (China) Qingzhong Deng, imec (Belgium) Bin Dong, Dalian Minzu University (China) Qiaoqiang Gan, University at Buffalo (United States) Hideo Isshiki, The University of Electro-Communications (Japan) Chongjun Jin, Sun Yat-Sen University (China) Yuchao Li, Jinan University (China) Xiangping Li, Jinan University (China) Di Liang, Hewlett Packard Labs (United States) Renmin Ma, Peking University (China) Yongfeng Mei, Fudan University (China) Xiaochen Sun, LaXense, Inc. (United States) Yating Wan, University of California, Santa Barbara (United States) Ruitao Wen, Massachusetts Institute of Technology (United States) Yun-Feng Xiao, Peking University (China) Weiwen Zou, Shanghai Jiao Tong University (China) Session Chairs
IntroductionMicro/Nano-Photonics, a branch of both optics and optical engineering, is a rising interdisciplinary field focusing on study of the behavior of light on micro/nano meter scale. With advancement of research on the micro/nano photonics, advanced ultra-small optoelectronic components with wide bandwidth and high operation speed have been proposed, designed, and fabricated. The advanced components could provide great potentials to revolutionize telecommunications, computation, sensing, optical storage, optical display, optical manipulation, solar energy utilization, and lithography, etc. The Micro/Nano-Photonics, Materials and Devices conference of OIT 2021 was successfully organized and provided a great communication platform for researchers working on related areas. More than 40 papers were accepted by the conference. The contents of the accepted papers, focused on the design, fabrication, and application of micro/nanostructures, include silicon photonics integration, active nanomaterials, plasmonics, biophotonics, nonlinear optics, nanostructure device, and fabrication technology. As invited speakers, renowned scholars have also presented their cutting-edge breakthroughs on the micro/nano photonics, materials and devices. As Conference Chairs we would first like to thank all authors and presenters for their very exciting research achievements and great contributions to the conference. Second, we would like to thank all the committee members for great support on the organization of the conference. Finally, we would like to thank the staff of SPIE for efforts in publishing the conference Proceedings. Baojun Li Xingjun Wang Lingling Huang Ya Sha Yi OrganizersOpto-Electronic Mechanic Technology and System Integration Chapter, CIS (China) Committee on Optoelectronic Technology, COS (China) Committee on Optics, China Ordnance Society (China) Optical Instrument Chapter, CIS (China) Beijing Institute of Technology (China) Tianjin University (China) Tsinghua University (China) Peking University (China) Nanjing University (China) Zhejiang University (China) Sichuan University (China) Nankai University (China) Capital Normal University (China) Beijing University of Posts and Telecommunications (China) Beihang University (China) Chongqing University (China) University of Shanghai for Science and Technology (China) Instrument Society of America (United States) Institute of Measurement and Control (United Kingdom) Hong Kong Institution of Engineers (Hong Kong, China) The Society of Measurement and Control (Japan) |
