Open Access Paper
26 July 2022 Front Matter: Volume 12279
Proceedings Volume 12279, 2021 International Conference on Optical Instruments and Technology: Optical Sensors and Applications; 1227901 (2022) https://doi.org/10.1117/12.2641680
Event: 2021 International Conference on Optical Instruments and Technology, 2022, Online Only
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 12279, including the Title Page, Copyright information, Table of Contents, and Conference Committee listings.

Optical Sensors and Applications

8–10 April 2022

Online Only, China

Sponsored by

CIS – China Instrument and Control Society (China)

Cosponsored and Published by

SPIE

Volume 12279

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in 2021 International Conference on Optical Instruments and Technology: Optical Sensors and Applications, edited by Xuping Zhang, Yuncai Wang, Hai Xiao, Proc. of SPIE 12279, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510655638

ISBN: 9781510655645 (electronic)

Published by

SPIE

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Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE).

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Symposium Committee

Symposium Chairs

  • Zheng You, CIS (China), Tsinghua University (China)

  • David Andrews, University of East Anglia (United Kingdom)

Symposium Co-chairs

  • Tianchu Li, National Institute of Metrology, China (China)

  • Songlin Zhuang, University of Shanghai for Science and Technology (China)

  • Liwei Zhou, Beijing Institute of Technology (China)

  • Shenghua Ye, Tianjin University (China)

  • Yimo Zhang, Tianjin University (China)

  • Guangjun Zhang, Southeast University (China)

  • Min Gu, University of Shanghai for Science and Technology (China)

  • Xiangang Luo, Institute of Optics and Electronics, CAS (China)

  • Jianjun Deng, China Academy of Engineering Physics (China)

  • Fengyi Jiang, Nanchang University (China)

Technical Program Chairs

  • Guofan Jin, Tsinghua University (China)

  • Tianchu Li, National Institute of Metrology (China)

Technical Program Co-chairs

  • Jinxue Wang, SPIE

  • Tiegen Liu, Tianjin University (China)

Local Organizing Committee Chairs

  • Youhua Wu, China Instrument and Control Society (China)

  • Tong Zhang, China Instrument and Control Society (China)

Local Organizing Committee Co-chairs

  • Qun Hao, Beijing Institute of Technology (China)

  • Guoqiang Ni, Beijing Institute of Technology (China)

General Secretaries

  • Tong Zhang, China Instrument and Control Society (China)

  • Li Zhang, China Instrument and Control Society (China)

Vice General Secretaries

  • Liquan Dong, Beijing Institute of Technology (China)

  • Yuejin Zhao, Beijing Institute of Technology (China)

  • Qican Zhang, Sichuan University (China)

  • Yu-nan Sun, Beijing Institute of Technology (China)

Local Organizing Committee

  • Xuping Zhang, Nanjing University (China)

  • Shangzhong Jin, China Jiliang University (China)

  • Liangcai Cao, Tsinghua University (China)

  • Yongtian Wang, Beijing Institute of Technology (China)

  • Chunqing Gao, Beijing Institute of Technology (China)

  • Jian Chen, Nanjing University of Posts and Telecommunications (China)

  • Shilong Pan, Nanjing University of Aeronautics and Astronautics (China)

  • Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, CAS (China)

  • Jigui Zhu, Tianjin University (China)

  • Baojun Li, Jinan University (China)

  • Cunlin Zhang, Capital Normal University (China)

  • Zeren Li, Shenzhen Technology University (China)

  • Libo Yuan, Guilin University of Electronic Technology (China)

  • Yongcai Guo, Chongqing University (China)

  • Tian Lan, Beijing Institute of Technology (China)

  • Cuiling Li, Beijing Institute of Technology (China)

Conference Committee

Conference Chairs

  • Xuping Zhang, Nanjing University (China)

  • Yuncai Wang, Guangdong University of Technology (China)

  • Hai Xiao, Clemson University (United States)

Conference Program Committee

  • Francisco Javier Arregui, Universidad Pública de Navarra (Spain)

  • Weihong Bi, Yanshan University (China)

  • Kevin Chen, University of Pittsburgh (United States)

  • Rongshen Chen, University of Birmingham (United Kingdom)

  • Weimin Chen, Chongqing University (China)

  • Zhe Chen, Jinan University (China)

  • Xinyong Dong, Guangdong University of Technology (China)

  • Fajie Duan, Tianjin University (China)

  • Xudong Fan, University of Missouri (United States)

  • Ming Han, University of Nebraska-Lincoln (United States)

  • Shibin Jiang, NP Photonics, Inc, (United States)

  • Wei Jin, Hong Kong Polytechnic University (Hong Kong, China)

  • Tiegen Liu, Tianjin University (China)

  • Gang-Ding Peng, University of New South Wales (Australia)

  • Yunjian Rao, University of Electronic Science and Technology of China (China)

  • Tingyun Wang, Shanghai University (China)

  • Anbo Wang, Virginia Polytechnic Institute and State University (United States)

  • Feng Wang, Nanjing University (China)

  • Liang Wang, Huazhong University of Science and Technology (China)

  • Tao Wei, University of Rhode Island (United States)

  • Libo Yuan, Guilin University of Electronic Technology (China)

  • Lin Zhang, Aston University (United Kingdom)

  • Ningmu Zou, Advanced Micro Devices (AMD) Inc. (United States)

Conference Review Committee

  • Weihong Bi, Yanshan University (China)

  • Kevin Chen, University of Pittsburgh (United States)

  • Weimin Chen, Chongqing University (China)

  • Xinyong Dong, China Jiliang University (China)

  • Fajie Duan, Tianjin University (China)

  • Ming Han, Michigan State University (United States)

  • Shibin Jiang, AdValue Photonics, Inc. (United States)

  • Wei Jin, The Hong Kong Polytechnic University (Hong Kong, China)

  • Tiegen Liu, Tianjin University (China)

  • Gang-Ding Peng, The University of New South Wales (Australia)

  • Anbo Wang, Virginia Polytechnic Institute and State University (United States)

  • Feng Wang, Nanjing University (China)

  • Liang Wang, Huazhong University of Science and Technology (China)

  • Tingyun Wang, Shanghai University (China)

  • Libo Yuan, Harbin Engineering University (China)

  • Tao Wei, The University of Rhode Island (United States)

  • Lin Zhang, Aston University (United Kingdom)

  • Ningmu Zou, Advanced Micro Devices, Inc. (United States)

Session Chairs

  • 1 Microstructure Optical Fiber Sensors

    • Junfeng Jiang, Tianjing University (China)

    • Xiaobei Zhang, Shanghai University (China)

  • 2 FBG Sensors

    • Ming Deng, Chongqing University (China)

  • 3 Distributed Optical Fiber sensors

    • Changrui Liao, Shenzhen University (China)

  • 4 Microstructure Optical Fiber Sensors

    • Tao Wei, University of Rhode Island (United States)

  • 5 Distributed Optical Fiber Sensors

    • Yongkang Dong, Harbin Institute of Technology (China)

    • Mingjiang Zhang, Taiyuan University of Technology (China)

  • 6 Special Optical Sensors

    • Yuan Gong, University of Electronic Science and Technology of China (China)

    • YunHan Luo, Jinan University (China)

Introduction

With distinct advantages such as high precision, fast response, immunity to electromagnetic interference and remote operation capability, optical sensors have traditionally been viewed as a high-end solution to many scientific and engineering problems that demand great performance. Fortunately, over the past decades, the rapid advancements in optical communications have brought to the market low-cost semiconductor lasers, photo detectors, optical fibers, and integrated optical components, which pave the way for optical sensors to enter our daily lives and land on factory floors. Optical sensors are now being used for measurement of various physical, chemical, and biological parameters, providing great solutions for a wide variety of sensing needs that are difficult to handle by other types of sensors. New optical sensing devices, configurations and systems are being proposed, developed, tested, and deployed at an unprecedented pace.

Since 2017, scientists, researchers and engineers around the world gathered in Beijing, China to present their latest research work in the Optical Sensor and Applications conference, as a part of the OIT Symposium. While it was postponed several times by the COVID-19 pandemic, the OIT Symposium was moved to an online format on 8 April 2022.

Nevertheless, the virtual meeting was quite a success. 48 research papers, including 26 oral presentations and 21 posters, were accepted and presented at the Optical Sensor and Applications conference, covering a wide variety of research fields focusing on the latest optical sensors, devices, systems, instrumentation, and signal processing methods. During the conference, the participating researchers shared the latest accomplishments, sparked ideas, envisioned next-generation technologies, challenged each other, and cherished friendships.

The chairs of Optical Sensor and Applications would like to thank our committee members, reviewers, authors and participants for their contributions and support that made the conference a great success. We are also grateful to the staff of SPIE for their support in publishing the volume of the Proceedings of SPIE.

Xuping Zhang

Yuncai Wang

Hai Xiao

Organizers

Opto-Electronic Mechanic Technology and System Integration Chapter, CIS (China)

Committee on Optoelectronic Technology, COS (China)

Committee on Optics, China Ordnance Society (China)

Optical Instrument Chapter, CIS (China)

Beijing Institute of Technology (China)

Tianjin University (China)

Tsinghua University (China)

Peking University (China)

Nanjing University (China)

Zhejiang University (China)

Sichuan University (China)

Nankai University (China)

Capital Normal University (China)

Beijing University of Posts and Telecommunications (China)

Beihang University (China)

Chongqing University (China)

University of Shanghai for Science and Technology (China)

Instrument Society of America (United States)

Institute of Measurement and Control (United Kingdom)

Hong Kong Institution of Engineers (Hong Kong, China)

The Society of Measurement and Control (Japan)

© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 12279", Proc. SPIE 12279, 2021 International Conference on Optical Instruments and Technology: Optical Sensors and Applications, 1227901 (26 July 2022); https://doi.org/10.1117/12.2641680
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KEYWORDS
Optical sensors

Fiber optics sensors

Magnetic sensors

Telecommunications

Sensors

Control systems

Lithium

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