Speckle pattern analysis of security holograms and related foils for quality assessment and authentication

Keerthy Krishnan S.; Sajan Ambadiyil; Avinash Kumar Jha; Radhakrishna Prabhu

doi:10.1117/12.2635446

28 October 2022 Speckle pattern analysis of security holograms and related foils for quality assessment and authentication

Keerthy Krishnan S., Sajan Ambadiyil, Avinash Kumar Jha, Radhakrishna Prabhu

Author Affiliations +

Proceedings Volume 12275, Counterterrorism, Crime Fighting, Forensics, and Surveillance Technologies VI; 1227509 (2022) https://doi.org/10.1117/12.2635446
Event: SPIE Security + Defence, 2022, Berlin, Germany

Abstract

A speckle pattern is produced by the mutual interference of a set of coherent wavefronts. Speckle patterns typically occur in diffuse reflections of monochromatic light such a laser light. When a rough surface is illuminated by a coherent light is imaged, a speckle pattern is observed in the image plane. This study involves the quality assessment and authentication of security holograms and its related foils by analyzing the speckle pattern generated from the specimen itself. Speckle pattern from various type of security holograms and foils are taken. By processing the image of the speckle pattern, the size of the speckles is analyzed using MATLAB software. By evaluating the size of the speckle generated, the feasibility of analyzing the quality and authenticity of the security hologram is assessed. The paper discusses about the experimental setup, image capturing, and processing method and the result obtained in detail.

Citation Download Citation

Keerthy Krishnan S., Sajan Ambadiyil, Avinash Kumar Jha, and Radhakrishna Prabhu "Speckle pattern analysis of security holograms and related foils for quality assessment and authentication", Proc. SPIE 12275, Counterterrorism, Crime Fighting, Forensics, and Surveillance Technologies VI, 1227509 (28 October 2022); https://doi.org/10.1117/12.2635446

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KEYWORDS

Holograms

Speckle

Speckle pattern

Silver

Thin film coatings

Gold

Atomic force microscopy

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