Paper
23 May 2022 Study on life and reliability technology of speed sensor of EMU
Yanjun Song, Ying Li, Xinpeng Li, Lin Yang, Abo Dou
Author Affiliations +
Proceedings Volume 12254, International Conference on Electronic Information Technology (EIT 2022); 122541Y (2022) https://doi.org/10.1117/12.2640071
Event: International Conference on Electronic Information Technology (EIT 2022), 2022, Chengdu, China
Abstract
In order to evaluate the performance status of the speed sensor for the key components of EMU (Electric Multiple Units), according to the main environmental factors experienced by the service life-time, the type test scheme and corresponding detection requirements of the speed sensor are formulated. Combined with the test results after each type test, the performance status of the speed sensor is checked, the main faults occurring are summarized, and the failure analysis is carried out. The speed sensor is not a full-life product (less than 30 years), so it is recommended to repair it in fifth class, and the main failure location and failure stress of the product are found out, which provides important basis for the maintenance of the repair cycle and repair system.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yanjun Song, Ying Li, Xinpeng Li, Lin Yang, and Abo Dou "Study on life and reliability technology of speed sensor of EMU", Proc. SPIE 12254, International Conference on Electronic Information Technology (EIT 2022), 122541Y (23 May 2022); https://doi.org/10.1117/12.2640071
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KEYWORDS
Sensors

Environmental sensing

Failure analysis

Resistance

Inspection

Reliability

Dielectrics

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