Paper
29 April 2022 Image calibration technology for radiation hardened CMOS image processor
Sichong Huang, Tiejun Lu, Zhenlin Lu, Zizheng Yang, Zixuan Tian
Author Affiliations +
Proceedings Volume 12247, International Conference on Image, Signal Processing, and Pattern Recognition (ISPP 2022); 122470B (2022) https://doi.org/10.1117/12.2636856
Event: 2022 International Conference on Image, Signal Processing, and Pattern Recognition, 2022, Guilin, China
Abstract
Affected by the total ionizing dose, the CMOS image sensor degrades and the fixed pattern noise increases. In order to improve the removal efficiency and effect of the current fixed pattern noise, an image correction method based on statistical filtering and wavelet analysis was proposed. Firstly, the image is segmented by selective down sampling. Next, a particular shaped Gaussian filter kernel is used to blur the image. The fuzzy image and the original image are then statistical extracted and compared. Finally, after median processing, the correction result is obtained. Experimental results show that SFAWA has a better processing performance.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sichong Huang, Tiejun Lu, Zhenlin Lu, Zizheng Yang, and Zixuan Tian "Image calibration technology for radiation hardened CMOS image processor", Proc. SPIE 12247, International Conference on Image, Signal Processing, and Pattern Recognition (ISPP 2022), 122470B (29 April 2022); https://doi.org/10.1117/12.2636856
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KEYWORDS
Image processing

Gaussian filters

Image filtering

Anisotropic filtering

CMOS technology

Digital filtering

Calibration

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