The influence of surface irregularity on optical system wavefront performance is well established, but typically irregularity analysis and specifications are limited to peak-to-valley or 3rd-order Seidel terms. As optical assembly wavefront specifications become tighter, higher order irregularity may need to be considered, particularly for surfaces away from the system pupil. This work presents a case study of an optical system with tightly controlled wavefront Zernike terms across the field. Using as-built diagnostic testing and optical modeling incorporating Fringe Zernike surface irregularity, higher order rotationally symmetric irregularities are determined to be the root-cause of specific wavefront Zernike failure modes. Sensitivity and tolerancing analysis are used to determine the required surface specification and provide feedback to the fabrication process, improving system first-pass yield.
|