Presentation + Paper
3 October 2022 Impact of higher order surface irregularity on system-level wavefront variation across the field
Charlie Granger, Kaia Williams, Matthew Brophy, Bryan Carter
Author Affiliations +
Abstract
The influence of surface irregularity on optical system wavefront performance is well established, but typically irregularity analysis and specifications are limited to peak-to-valley or 3rd-order Seidel terms. As optical assembly wavefront specifications become tighter, higher order irregularity may need to be considered, particularly for surfaces away from the system pupil. This work presents a case study of an optical system with tightly controlled wavefront Zernike terms across the field. Using as-built diagnostic testing and optical modeling incorporating Fringe Zernike surface irregularity, higher order rotationally symmetric irregularities are determined to be the root-cause of specific wavefront Zernike failure modes. Sensitivity and tolerancing analysis are used to determine the required surface specification and provide feedback to the fabrication process, improving system first-pass yield.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charlie Granger, Kaia Williams, Matthew Brophy, and Bryan Carter "Impact of higher order surface irregularity on system-level wavefront variation across the field", Proc. SPIE 12215, Optical Modeling and Performance Predictions XII, 1221502 (3 October 2022); https://doi.org/10.1117/12.2632452
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KEYWORDS
Wavefronts

Spherical lenses

Tolerancing

Data modeling

Surface finishing

Systems modeling

Optics manufacturing

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