Presentation + Paper
29 August 2022 PixDD: a multi-pixel silicon drift detector for high-throughput spectral-timing studies
F. Ceraudo, F. Ambrosino, P. Bellutti, G. Bertuccio, G. Borghi, R. Campana, M. Caselle, D. Cirrincione, I. Dedolli, E. Del Monte, Y. Evangelista, M. Feroci, F. Ficorella, M. Fiorini, F. Fuschino, M. Gandola, M. Grassi, C. Labanti, P. Loffredo, G. Lombardi, P. Malcovati, F. Mele, A. Morbidini, R. Piazzolla, A. Picciotto, A. Rachevski, I. Rashevskaya, A. Tobia, A. Vacchi, A. Volpe, G. Zampa, N. Zampa, N. Zorzi
Author Affiliations +
Abstract
The Pixelated silicon Drift Detector (PixDD) is a two-dimensional multi-pixel X-ray sensor based on the technology of Silicon Drift Detectors, designed to solve the dead time and pile-up issues of photon-integrating imaging detectors. Read out by a two-dimensional self-triggering Application-Specific Integrated Circuit named RIGEL, to which the sensor is bump-bonded, it operates in the 0:5 — 15 keV energy range and is designed to achieve single-photon sensitivity and good spectroscopic capabilities even at room temperature or with mild cooling (< 150 eV resolution at 6 keV at 0 °C). The paper reports on the design and performance tests of the 128-pixel prototype of the fully integrated system.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Ceraudo, F. Ambrosino, P. Bellutti, G. Bertuccio, G. Borghi, R. Campana, M. Caselle, D. Cirrincione, I. Dedolli, E. Del Monte, Y. Evangelista, M. Feroci, F. Ficorella, M. Fiorini, F. Fuschino, M. Gandola, M. Grassi, C. Labanti, P. Loffredo, G. Lombardi, P. Malcovati, F. Mele, A. Morbidini, R. Piazzolla, A. Picciotto, A. Rachevski, I. Rashevskaya, A. Tobia, A. Vacchi, A. Volpe, G. Zampa, N. Zampa, and N. Zorzi "PixDD: a multi-pixel silicon drift detector for high-throughput spectral-timing studies", Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X, 1219116 (29 August 2022); https://doi.org/10.1117/12.2630450
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KEYWORDS
Sensors

Silicon

X-rays

Photons

X-ray detectors

Spectral resolution

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