Presentation
29 August 2022 Performance of photon counting, optical to near-IR Microwave Kinetic Inductance Detectors utilizing proximity effects in Ti / TiN multilayers
Author Affiliations +
Abstract
MKIDs are promising candidates for next generation optical-IR instrumentation as they combine single pixel energy resolution, photon counting and vanishing dark counts with the possibility of megapixel arrays. Ti/TiN multilayers have significant advantages for MKIDs as they allow full control of the superconducting energy gap. We will compare the performance of different Ti/TiN stacks varying in Tc, layer number and film thickness. We have already achieved Qi up to 150 000 and will demonstrate how to control energy resolution and Qi and explore the proximity effect’s limits in the Ti/TiN system.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerhard Ulbricht, Mario De Lucia, Eoin Baldwin, Jack D. Piercy, Oisin Creaner, Colm Bracken, and Tom Ray "Performance of photon counting, optical to near-IR Microwave Kinetic Inductance Detectors utilizing proximity effects in Ti / TiN multilayers", Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X, 1219106 (29 August 2022); https://doi.org/10.1117/12.2626869
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KEYWORDS
Multilayers

Sensors

Tin

Inductance

Microwave radiation

Photon counting

Image resolution

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