Single-shot wavelength meter on a photonic chip for absolute distance measurement using frequency scanning interferometry

C. R. Coggrave; P. D. Ruiz; C. A. Pallikarakis; J. M. Huntley; H. Du; M. Banakar; X. Yan; D. T. Tran; C. G. Littlejohns

doi:10.1117/12.2626785

20 May 2022 Single-shot wavelength meter on a photonic chip for absolute distance measurement using frequency scanning interferometry

C. R. Coggrave, P. D. Ruiz, C. A. Pallikarakis, J. M. Huntley, H. Du, M. Banakar, X. Yan, D. T. Tran, C. G. Littlejohns

Author Affiliations +

Proceedings Volume 12137, Optics and Photonics for Advanced Dimensional Metrology II; 1213703 (2022) https://doi.org/10.1117/12.2626785
Event: SPIE Photonics Europe, 2022, Strasbourg, France

Abstract

A chip-scale solid-state wavelength measuring device based on a silicon photonics platform is presented. It has no moving parts and allows single-shot wavelength measurement with high precision over a nominal bandwidth of 40 nm in the Oband. The wavemeter design is based on multimode interferometer (MMI) couplers and a multi-band Mach–Zehnder interferometer (MZI) structure with exponentially increasing optical path differences and in-phase quadrature detection. The design of the MMI couplers is supported by simulations using the Finite-Difference Time-Domain (FDTD) method. The design, experimental evaluation, and calibration of the device are discussed. Observed performance indicates a spectral support of 38.069 nm (i.e., frequency bandwidth 6.608 THz), with a resolution of 8.3 pm (1σ), corresponding to 1 part in 4,587. This wavelength meter approach has emerged from a need in absolute distance measurements using frequency scanning interferometry, where knowledge of the instantaneous wavelength of a tunable laser is required to relate signal frequency with target range. We also present an adaptive delay line on a chip, demonstrate its use for range measurements, and suggest how the wavelength meter could evolve for real-time applications.

Conference Presentation

Citation Download Citation

C. R. Coggrave, P. D. Ruiz, C. A. Pallikarakis, J. M. Huntley, H. Du, M. Banakar, X. Yan, D. T. Tran, and C. G. Littlejohns "Single-shot wavelength meter on a photonic chip for absolute distance measurement using frequency scanning interferometry", Proc. SPIE 12137, Optics and Photonics for Advanced Dimensional Metrology II, 1213703 (20 May 2022); https://doi.org/10.1117/12.2626785

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