Polarization-interference mapping of polystyrene layers in the flaw detection of its polycrystalline structure

O. Ushenko; V. Ushenko; A. Nehrych; R. Besaha; P. Ryabiy; Ch. Felde; N. Horodynska; O. Konovchuk; O. Vanchulyak

doi:10.1117/12.2617047

20 December 2021 Polarization-interference mapping of polystyrene layers in the flaw detection of its polycrystalline structure

O. Ushenko, V. Ushenko, A. Nehrych, R. Besaha, P. Ryabiy, Ch. Felde, N. Horodynska, O. Konovchuk, O. Vanchulyak

Author Affiliations +

Proceedings Volume 12126, Fifteenth International Conference on Correlation Optics; 121262E (2021) https://doi.org/10.1117/12.2617047
Event: Fifteenth International Conference on Correlation Optics, 2021, Chernivtsi, Ukraine

Abstract

Polymeric materials based on polystyrene (PS) are one of the most common polygraph materials. It is necessary to differentiate between of optical homogeneity of the polycrystalline structure of PS. We aim to demonstrate the use of a polarization interference method to allow quick and easy practical differentiation between PS samples with different types of deformations. Polycrystalline optically homogeneous and mechanically stressed samples of PS were investigated. We map the local contrast of interference patterns in microscopic images of образцов PS using a set-up polarizing interferometer, based on the superposition of a reference laser beam with the interference pattern of the sample in the image plane. The local contrast distributions can be directly related to the polycrystalline structure of образцов PS. The dependences of the magnitude of the 1st to 4th order statistical moments of the local contrast polarization-interference distribution are determined. To determine the diagnostic potential of the method две groups of polycrystalline образцов PS were formed. The first group contained 16 optically homogeneous PS samples, while the second contained 16 PS samples with residual mechanical stresses.

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O. Ushenko, V. Ushenko, A. Nehrych, R. Besaha, P. Ryabiy, Ch. Felde, N. Horodynska, O. Konovchuk, and O. Vanchulyak "Polarization-interference mapping of polystyrene layers in the flaw detection of its polycrystalline structure", Proc. SPIE 12126, Fifteenth International Conference on Correlation Optics, 121262E (20 December 2021); https://doi.org/10.1117/12.2617047

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KEYWORDS

Picosecond phenomena

Phase shifts

Polymers

Jones vectors

Polarization

Active optics

Birefringence

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