Presentation + Paper
19 November 2021 The influence of oxygen partial pressure on the properties of evaporated alumina thin films
Tsion Teklemarim, Christopher J. Stolz, Matt Brophy, Michael Pierce, Pete Kupinski
Author Affiliations +
Abstract
The effect of oxygen partial pressure on the properties of Al2O3 films deposited by electron beam evaporation has been investigated through a combination of spectrophotometric and interferometric characterization techniques. As oxygen partial pressure increases, a decrease in the refractive index is observed, as well as a shift towards less tensile films once they are exposed to ambient conditions. This decrease in tensile stress was observed to be correlated with water content in the films. Increasing oxygen partial pressure during deposition improved film stoichiometry, absorption, and laser induced damage threshold (LIDT) at 351 nm.
Conference Presentation
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Tsion Teklemarim, Christopher J. Stolz, Matt Brophy, Michael Pierce, and Pete Kupinski "The influence of oxygen partial pressure on the properties of evaporated alumina thin films", Proc. SPIE 11910, Laser-Induced Damage in Optical Materials 2021, 119100Y (19 November 2021); https://doi.org/10.1117/12.2599213
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KEYWORDS
Oxygen

Aluminum

Absorption

Thin films

Water

Refractive index

Silica

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