Phase Retardation Measurement For Simple Kinoform Technology

Maciej Sypek

doi:10.1117/12.963886

12 April 1990 Phase Retardation Measurement For Simple Kinoform Technology

Maciej Sypek

Proceedings Volume 1183, Holography '89; (1990) https://doi.org/10.1117/12.963886
Event: Holography '89, 1989, Varna, Bulgaria

Abstract

The paper presents a new technique of quantitative performing of kinoforms. During preparing the kinoform a photochemical operations have been used. The phase retardation in each zone is controlled by a new diffraction technique. A standard photographic plate glass substrate is sufficient for described method.

Citation Download Citation

Maciej Sypek "Phase Retardation Measurement For Simple Kinoform Technology", Proc. SPIE 1183, Holography '89, (12 April 1990); https://doi.org/10.1117/12.963886

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