Counting the plasmonic generation of non-thermal hot carrier with a AlGaN/GaN high electron mobility transistor

Chun-Yu Liu; Chi-Ching Liu; Wei-Chi Lai; Yung-Chiang Lan; Yun-Chorng Chang

doi:10.1117/12.2594103

1 August 2021 Counting the plasmonic generation of non-thermal hot carrier with a AlGaN/GaN high electron mobility transistor

Chun-Yu Liu, Chi-Ching Liu, Wei-Chi Lai, Yung-Chiang Lan, Yun-Chorng Chang

Author Affiliations +

Proceedings Volume 11797, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XIX; 1179711 (2021) https://doi.org/10.1117/12.2594103
Event: SPIE Nanoscience + Engineering, 2021, San Diego, California, United States

Abstract

In this study, we demonstrate the ability to exclude the thermal effect and detect the generation of non-thermal hot carriers by surface plasmon using an AlGaN/GaN high-electron-mobility transistor. We will also provide a theoretical model to explain the detecting mechanism. This proposed platform is very sensitive, which is at least two orders of magnitude more sensitive compared to the previous reports, can detect the hot carriers generated from discrete nanostructures illuminated by a continuous wave light. The quantitative measurements of hot carrier generation also open a new way to optimize the plasmonic nanoantenna design in many applications.

Conference Presentation

Citation Download Citation

Chun-Yu Liu, Chi-Ching Liu, Wei-Chi Lai, Yung-Chiang Lan, and Yun-Chorng Chang "Counting the plasmonic generation of non-thermal hot carrier with a AlGaN/GaN high electron mobility transistor", Proc. SPIE 11797, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XIX, 1179711 (1 August 2021); https://doi.org/10.1117/12.2594103

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