Modal inspection technology based on transverse second harmonic generation in single nonlinear micro/nanowaveguide

C. G. Xin; Y. R. Zhou

doi:10.1117/12.2587429

2 December 2020 Modal inspection technology based on transverse second harmonic generation in single nonlinear micro/nanowaveguide

C. G. Xin, Y. R. Zhou

Author Affiliations +

Proceedings Volume 11717, 24th National Laser Conference & Fifteenth National Conference on Laser Technology and Optoelectronics; 117172W (2020) https://doi.org/10.1117/12.2587429
Event: 24th National Laser Conference & Fifteenth National Conference on Laser Technology and Optoelectronics, 2020, Shanghai, China

Abstract

We demonstrate a method based on transverse second harmonic generation (TSHG) for in-situ modal inspection of single nonlinear micro/nanowaveguide. CdS nanobelts (NBs) with width of several micrometers and length of a few hundred micrometers are synthesized by a thermal evaporation process. Transverse second harmonic (TSH) signal is observed as pumping light coupled inside a single CdS NB from both ends simultaneously. As a result of multimode interference, periodic interference patterns are observed along the whole NB. The influence of multimode interaction on TSHG effect inside single nonlinear micro/nanowaveguide is studied both theoretically and experimentally. Using fast Fourier transform (FFT), the TSH patterns are analyzed. The results indicate several particular modes inside the NB, which is in great well with calculated results. The method can be in principle operated in varieties of nonlinear micro/nanowavegudies including ZnO, CdS, CdTe, GaAs and LiNbO₃.

Citation Download Citation

C. G. Xin and Y. R. Zhou "Modal inspection technology based on transverse second harmonic generation in single nonlinear micro/nanowaveguide", Proc. SPIE 11717, 24th National Laser Conference & Fifteenth National Conference on Laser Technology and Optoelectronics, 117172W (2 December 2020); https://doi.org/10.1117/12.2587429

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